High resolution EMC and EMI testing has never been this fast! (min. resolution ≈ 60 microns)
High density board & IC designers: accelerate design process by reducing EMC/EMI test times
Tired of waiting long hours to detect the causes of chip level EMC problems on your PCB?
Until now, conventional test methods like automated probes or hand-held probes were the only options to diagnose EMC problems on high density boards or chipsets. Testing a complete board with these conventional test methods can take half a day; even sometimes a day!
Looking for a fast, reliable and economical way to diagnose & debug your high density board after failing the compliance test in an anechoic chamber?
World’s fastest EMC/EMI diagnostic system EMxpert has been reinvented to assist high density board designers and chipset manufacturers to visualize the root causes of potential EMC and EMI problems during pre- and post-EMC compliance testing.
ERX+ obtains the 60 microns high resolution at an unrivalled speed by combining an electronically switched array of 1,218 probes with mechanical motion.
Now, you can identify hot spots or current loops on your high density board or chipset in seconds with ERX+ Level 1 resolution and then zoom into the problem area by selecting the resolution level based on the density of the board design.
With ERX+, for a fraction of an anechoic chamber cost you can quickly and easily:
- Analyze your high speed, high power and/or high density/complexity PCB designs.
- Visualize the root causes of potential EMC and EMI problems.
- Find, characterize, and address unintended radiators or RF leakage.
- Pinpoint in less than a second the cause of a design failure even an intermittent problem.
- Prototype & test new designs, components and forms.
- Test & optimize multiple PCB (printed circuit board) design iterations on your lab-bench.
- Pre-test & resolve EMC and EMI problems early on to avoid unexpected EMC compliance test results
…all for a fraction of the cost of an anechoic chamber.
Identify hot spots or current loops in seconds with ERX+ Level 1 resolution and then zoom into the problem area
ERX+ provides spatial and spectral scans that allow design teams to address EMC design problems at their lab-bench in real-time.
Spectral scan measures and displays the maximum amplitude vs. frequency of the magnetic field strength over the scanned area. To characterize emissions, ERX+ quickly scans the board across a broad frequency range (150kHz – 8GHz). You can then select and characterize specific frequencies to observe how the noise evolves spatially across the frequency range. This allows the design team to map the noise, confirm its source, and implement appropriate mitigation. A spectral scan result is shown below. You can mouse over the spectral graph and analyze the problem frequency and amplitude.
The ultimate advantage of ERX+ is the real-time spatial scan which measures the magnetic field of radiated electromagnetic emissions from the DUT at a single frequency as a function of position. ERX+ maps near-field emissions generated by current flow on the surface of the board. Measurements occur in real-time and this allows the design team to compare different design versions in seconds. Below graphic shows level 1 and level 7 spatial scan results of a high density board.
Isolate individual traces and vias, and highlight coupling points between traces
ERX+ allows the designers and the engineers to find the source of emissions and the path taken by the problem emissions down to a single trace and via across multiple PCB layers. An example is shown below.