Avoid unexpected anechoic chamber test results

Complexity of wireless device designs is increasing. Performance expectations (gain, efficiency, pattern characteristics, etc.) constitute primary challenges in designing stand alone or embedded antennas. Designs are becoming ever more complex with a single device incorporating multiple technologies such as cellular, WiFi, Bluetooth, LTE, MIMO, RFID and GPS. Antenna performance is simply affected by the increasing number of antenna, components co-located with the antenna, enclosures, electronic sub-assemblies, and PCBs. Having immediate access to quick and reliable antenna test equipment is critical.

RFxpert’s unrivalled array of automatically switched probes calculates accurate far-field patterns and radiated power levels based on near-field measurements in less than a second.

Real-time scanning capabilities of RFxpert deliver significant design advantages not only at the design and development stages but also throughout the product lifecycle. Having immediate access to far-field data on your lab-bench significantly saves time and cost by decreasing dependence on time consuming and costly anechoic chambers. Now, wireless engineers and designers don’t lose time waiting in congested anechoic chamber lines to test multiple design iterations and optimize complex embedded antenna designs. They can troubleshoot far-field radiation patterns with novel very-near-field results, including amplitude, polarity and phase that give insights into the root cause of antenna performance challenges. RFxpert allows for more efficient and cost-effective solutions, project cost containment, and accelerated time-to-market.