Calgary, AB, Canada – September 19, 2016: EMSCAN will present a paper at the IEEE Seattle EMC & MTT Joint Chapter Meeting on October 3, 2016. The meeting will be held at The Boeing Company. 

Using Very-Near-Field Scanning Arrays to Test Classic EMC and Antenna Problems

Ruska Patton, M.Sc. – Director of Product Management – is responsible for the evolution of EMSCAN's real-time near field measurement solutions. He has a comprehensive understanding of general EMC, EMI and RF design and troubleshooting, with excellent skills in related software applications and programming. Mr. Patton holds both a B.Sc. and M.Sc. in electrical engineering from the University of Saskatchewan. During his time at university, he was recognized with numerous IEEE awards and a distinguished research scholarship.

Very-near-field test systems created by EMSCAN are able to accurately measure and display emissions from a device in seconds. A spatial map of the emissions allows designers to quickly identify which parts of the PCB are conducting currents and possibly causing EMC issues. For antenna applications the very-near-field data can be converted, in real time, to far-field to estimate radiated power and efficiency. This allows designers to check antenna and wireless device performance without always needing to resort to a chamber. This presentation will show how the probe arrays of these very-near-field systems work and how they transform results to the far-field. There will be a demonstration of their capabilities on some test boards with classic EMC problems and on some small commercial antennas.

EMSCAN is the world leading developer of FAST magnetic very-near-field measurement technologies and applications since 1989, providing real-time test solutions to antenna and PCB designers and verification engineers, without the need for a chamber.
The EMxpert, a family of compact EMC and EMI diagnostic tools, and the RFxpert, a family of antenna measurement tools, enable engineers to quickly optimize their designs. EMSCAN solutions dramatically increase designer productivity and substantially reduce time-to-market and project development costs.