Did you miss our webinar “Improved Antenna Test System for Fast & Accurate Pattern Measurement?”
Calgary, AB, Canada – September 09, 2016: Watch our webinar to learn about how to easily and quickly check antenna and wireless device performance without always needing to resort to chambers. Click here to watch it NOW!
Very-near-field test systems created by EMSCAN are able to accurately measure radiated power and efficiency for antennas. This allows designers to easily and quickly check antenna and wireless device performance without always needing to resort to chambers. Recent advances in the transformation used to convert between the very-near-field and the far-field means that radiation patterns can now be measured more accurately. These improvements to pattern accuracy mean that gain measurements can now be done on the benchtop scanners provided by EMSCAN again reducing the reliance on chambers. This presentation will show how very-near-field systems can accurately evaluate antenna performance including gain measurements in seconds. An explanation of the recent advances along with comparative measurements will be provided.
Ruska Patton MBA, M.Sc. is responsible for the evolution of EMSCAN's real-time very-near-field measurement solutions. Having started with EMSCAN as Design Engineer and then Manager of the Design Group, Mr. Patton now leads the development of new EMSCAN solutions from concept through to successful products in market. Mr. Patton has authored academic papers, presented seminars and holds several patents related to near-field scanning.
Click here to watch it NOW!
EMSCAN is the world leading developer of FAST magnetic very-near-field measurement technologies and applications since 1989, providing real-time test solutions to antenna and PCB designers and verification engineers, without the need for a chamber.
The EMxpert, a family of compact EMC and EMI diagnostic tools, and the RFxpert, a family of antenna measurement tools, enable engineers to quickly optimize their designs. EMSCAN solutions dramatically increase designer productivity and substantially reduce time-to-market and project development costs. www.emscan.com