Visit EMSCAN (booth 1332) at the IEEE IMS 2016 in San Francisco, CA between May 24 and 26
San Francisco, CA, USA – April 28, 2016: EMSCAN will showcase the world's largest real-time antenna pattern measurement system: RFX2 and the world's fastest high-resolution EMC/EMI scanner at the IEEE IMS 2016 at the Moscone Center in San Francisco between May 24 and 26.
The EMxpert family helps you to rapidly diagnose and solve EMC/EMI problems in a single design cycle. It provides unique pre- and post-EMC compliance testing that images real-time emissions. EMSCAN will provide information about the world’s fastest high-resolution EMC scanner, ERX+. With the ERX+ you can diagnose and debug EMC/EMI problems between 150 kHz and 8 GHz with seven different levels of resolution (120 microns – 7.5 mm).
The RFxpert family characterizes antennas without the need for a chamber. It provides far-field patterns, bisections, EIRP and TRP in less than a second. Novel near-field results, including amplitude, polarity and phase give insights into the root causes of antenna performance challenges and help troubleshoot far-field radiation patterns. EMSCAN will provide information about the RFxpert OTA Phantom Head+Hand Test Kit which allows the mobile device manufacturers & wireless service providers to measure TRP of their devices in seconds on their lab-bench.
Visit our booth #1332 at IEEE IMS 2016 at the Moscone Center in San Francisco between May 24 and 26, 2016.
EMSCAN is the world leading developer of FAST magnetic very-near-field measurement technologies and applications since 1989, providing real-time test solutions to antenna and PCB designers and verification engineers, without the need for a chamber.
The EMxpert, a family of compact EMC and EMI diagnostic tools, and the RFxpert, a family of antenna measurement tools, enable engineers to quickly optimize their designs. EMSCAN solutions dramatically increase designer productivity and substantially reduce time-to-market and project development costs. www.emscan.com