Calgary, AB, Canada – October 07, 2015: Are you looking for a new method for debugging when your device fails compliance tests or to diagnose root causes of failures? Click here to register!

Date: Wednesday, October 28, 2015

Time: 8:00 AM PT, 11:00 AM ET, 15:00 UTC

Overview:
EMC chambers are not the best tool to use for debugging when a device fails compliance tests or to diagnose root causes of failures. Systematic problem isolation of components can be effective but it is slow and does not always deliver a resolution. The array-based very near field scanning technique developed by EMSCAN brings real-time evaluation of the spatial distribution of emissions to problem solving. A new method that combines the array of sensors with mechanical motion provides the fastest high resolution scanning available and allows designers to peer inside the IC. Test results from this new system on real world ICs and an application showing how the spatial distribution of emissions can be used to solve problems will be presented.

Presenter:
Ruska Patton, M.Sc. – Director of Product Management – is responsible for the evolution of EMSCAN’s real-time near field measurement solutions. He has a comprehensive understanding of general EMC, EMI and RF design and troubleshooting, with excellent skills in related software applications and programming. Mr. Patton holds both a B.Sc. and M.Sc. in electrical engineering from the University of Saskatchewan. During his time at university, he was recognized with numerous IEEE awards and a distinguished research scholarship.

Click here to register!

About EMSCAN
EMSCAN is the world leading developer of FAST magnetic very-near-field measurement technologies and applications since 1989, providing real-time test solutions to antenna and PCB designers and verification engineers, without the need for a chamber.
The EMxpert, a family of compact EMC and EMI diagnostic tools, and the RFxpert, a family of antenna measurement tools, enable engineers to quickly optimize their designs. EMSCAN solutions dramatically increase designer productivity and substantially reduce time-to-market and project development costs. www.emscan.com