Hanover, NJ, USA – October 02, 2015EMSCAN was invited to present a paper at the IEEE New Jersey Chapter on October 1, 2015. Kasra Payandehjoo presented the paper "Antenna Measurement with Fast Scanning Techniques".

The growing presence of wireless and electronic applications across a broad array of industries has created a high demand for effective and economic performance test measurements. Unfortunately, the acquisition and maintenance costs, and the physical real estate requirements associated with conventional chamber systems is making this more and more difficult to achieve. Furthermore, characterization of large and/or low frequency antennas in a far-field chamber or compact range measurement system is often too costly and in many cases impractical. An alternative to direct far-field measurement exists, based on very-near-field scanning. An array of electronically switched probes eliminates the need for mechanical movement of the probe and hence drastically reduces measurement time; the very-near-fields are then transformed to far-field in a hemisphere in less than a second. This technique is also scalable to an arbitrarily large antenna. Very-near-field techniques enable Antenna Engineers to quickly evaluate and optimize designs at their desk by providing over-the-air real-time performance results for antennas and wireless devices.

EMSCAN is the world leading developer of FAST magnetic very-near-field measurement technologies and applications since 1989, providing real-time test solutions to antenna and PCB designers and verification engineers, without the need for a chamber.
The EMxpert, a family of compact EMC and EMI diagnostic tools, and the RFxpert, a family of antenna measurement tools, enable engineers to quickly optimize their designs. EMSCAN solutions dramatically increase designer productivity and substantially reduce time-to-market and project development costs. www.emscan.com