Los Angeles, CA, USA – September 18, 2015EMSCAN was invited to present a paper at the IEEE Los Angeles Chapter on September 17, 2015. Kasra Payandehjoo presented the paper “Fast and Effective Characterization of Large Antennas using Very-Near-Field Measurement Techniques”.

EMSCAN is the world leading developer of FAST magnetic very-near-field measurement technologies and applications since 1989, providing real-time test solutions to antenna and PCB designers and verification engineers, without the need for a chamber.
The EMxpert, a family of compact EMC and EMI diagnostic tools, and the RFxpert, a family of antenna measurement tools, enable engineers to quickly optimize their designs. EMSCAN solutions dramatically increase designer productivity and substantially reduce time-to-market and project development costs. www.emscan.com