Hanover, NJ, USA – September 01, 2015EMSCAN will showcase the world's fastest antenna pattern measurement tool RFxpert RFX and EMC/EMI diagnostic system EMxpert EHX at the IEEE regional event on October 01, 2015 in Hanover, NJ, USA. he RFxpert RFX characterizes antennas without the need for a chamber. It provides far-field patterns, bisections, EIRP and TRP in less than a second. Novel near-field results, including amplitude, polarity and phase give insights into the root causes of antenna performance challenges and help troubleshoot far-field radiation patterns.

Visit our booth to explore real-time antenna pattern measurement and EMC/EMI diagnostic systems. The regional event will be held at the Hanover Manor on October 1 between 8:50 am and 4:40 pm.

EMSCAN is dedicated to meet engineers and designers all around the world through local IEEE events. If you want EMSCAN to exhibit or present a technical paper at your local IEEE event, please contact us.

EMSCAN is the world leading developer of FAST magnetic very-near-field measurement technologies and applications since 1989, providing real-time test solutions to antenna and PCB designers and verification engineers, without the need for a chamber.
The EMxpert, a family of compact EMC and EMI diagnostic tools, and the RFxpert, a family of antenna measurement tools, enable engineers to quickly optimize their designs. EMSCAN solutions dramatically increase designer productivity and substantially reduce time-to-market and project development costs. www.emscan.com