Vancouver, BC, Canada – July 20, 2015: EMSCAN is proud to announce that one of our Technical Advisory Board member, Jean-Charles Bolomey, received the IEEE Joseph F. Keithley Award sponsored by Keithley Instruments and the IEEE Instrumentation and Measurement Society for his pioneering contributions to efficient modulated probe array technology for fast electromagnetic near-field techniques and microwave imagery. We would like to extend our congratulations to Jean-Charles Bolomey!

EMSCAN is the world leading developer of FAST magnetic very-near-field measurement technologies and applications since 1989, providing real-time test solutions to antenna and PCB designers and verification engineers, without the need for a chamber.
The EMxpert, a family of compact EMC and EMI diagnostic tools, and the RFxpert, a family of antenna measurement tools, enable engineers to quickly optimize their designs. EMSCAN solutions dramatically increase designer productivity and substantially reduce time-to-market and project development costs.