Vancouver, BC, Canada – June 15, 2015EMSCAN will present a paper at the IEEE AP-S 2015 Symposium during Antenna Measurement Concepts and Techniques. The title of the paper is “Very-Near-Field Testing of Large Antennas in Lab Environment”.
Kasra Payandehjoo (Chris Payan), will present the paper on Wednesday, July 22 at 4:20 pm in Salon 2. The authors of the paper are Ruska Patton, M.Sc. Director of Product Management and Kasra Payandehjoo (Chris Payan), Ph.D. ECE, Principal Antenna Engineer.

This article presents a compact set-up for characterization of large antennas. The proposed technique uses EMSCAN’s RFxpert system. Multiple near-fields scans, 0.16m2 each, are patched together to capture near-field radiation from large antennas. The effect of the width of the scan area and the lab environment is investigated herein for a reconfigurable base station antenna. Far-field patterns at 750 MHz and 1850 MHz show good agreement with chamber data in terms of shape, beamwidth, and directivity. Based on the investigations, the use of an absorber sheet for suppression of higher order interactions between the scanner and the antenna is strongly recommended. It is also demonstrated that a scan area as narrow as the width of the scanner itself is often sufficient to capture the fan-shaped radiation pattern of the base-station antenna.

EMSCAN is the world leading developer of FAST magnetic very-near-field measurement technologies and applications since 1989, providing real-time test solutions to antenna and PCB designers and verification engineers, without the need for a chamber.
The EMxpert, a family of compact EMC and EMI diagnostic tools, and the RFxpert, a family of antenna measurement tools, enable engineers to quickly optimize their designs. EMSCAN solutions dramatically increase designer productivity and substantially reduce time-to-market and project development costs.