EMSCAN at Local IEEE Events: IEEE Milwaukee Chapter EMC Seminar
Milwaukee, WI, USA – April 01, 2015: EMSCAN will showcase world’s fastest high resolution EMC scanner and the antenna pattern measurement tool at IEEE Milwaukee Chapter on April 14, 2015 in Milwaukee, WI, USA. The world’s fastest high-resolution EMC scanner ERX+ enables the PCB and design engineers to diagnose EMC/EMI problems between 150 kHz and 8 GHz with seven different levels of resolution (120 microns – 7.5 mm).
EMSCAN will also exhibit the world’s only real-time antenna pattern measurement system: RFX.
Visit our booth to explore real-time EMC/EMI and antenna pattern measurement systems. The seminar will be held at the Crowne Plaza Milwaukee Airport on April 14 between 8:30 am and 5:45 pm.
EMSCAN is dedicated to meet engineers and designers all around the world through local IEEE events. If you want EMSCAN to exhibit or present a technical paper at your local IEEE event, please contact us.
EMSCAN is the world leading developer of FAST magnetic very-near-field measurement technologies and applications since 1989, providing real-time test solutions to antenna and PCB designers and verification engineers, without the need for a chamber.
The EMxpert, a family of compact EMC and EMI diagnostic tools, and the RFxpert, a family of antenna measurement tools, enable engineers to quickly optimize their designs. EMSCAN solutions dramatically increase designer productivity and substantially reduce time-to-market and project development costs. www.emscan.com