Santa Clara, CA, USA – March 19, 2015: EMSCAN will present a paper during a half-day workshop organized by CST of America Inc. at the 2015 IEEE EMC – SI Symposium in Santa Clara. The workshop is about "Field Sources and Their Application in Computational EMC" and will start at 2 pm on Friday, March 20.

Kasra Payandehjoo (Chris Payan), Ph.D. ECE, Principal Antenna Engineer, will present " Very Near Field Measurements as the Basis for Far-Field Computations". The focus of the presentation will be on comparing measured near-field results with simulated near-field results.

Abstract of the workshop:
This workshop will discuss the use of measured and simulated fields as field sources in computational electromagnetics models. Field sources can be used to replace the geometry of detailed sources thereby reducing complexity in EM models. The workshop will give examples of using field sources to represent antennas and applying the sources in numerical models to assess installed antenna performance and co-site EMI on various platforms. The workshop will also discuss the use of PCB near field scans as field sources for radiated emissions analysis.
The workshop will gives examples of using measured antenna and PCB fields as sources in numerical models. Examples of a multi-scale approach to modeling through the use of field sources will also be given. Validation cases will be provided and the benefits and limitations of field sources highlighted.

EMSCAN is the world leading developer of FAST magnetic very-near-field measurement technologies and applications since 1989, providing real-time test solutions to antenna and PCB designers and verification engineers, without the need for a chamber.
The EMxpert, a family of compact EMC and EMI diagnostic tools, and the RFxpert, a family of antenna measurement tools, enable engineers to quickly optimize their designs. EMSCAN solutions dramatically increase designer productivity and substantially reduce time-to-market and project development costs.