Missed our latest webinar: “Real-time EMC/EMI testing using very-near-field methods for FF problems”
Calgary, AB, Canada – September 05, 2014: Did you miss our latest webinar “Real-time EMC/EMI testing using very-near-field Methods for far-field problems”? And you are still facing EMI and EMC issues in a pre- and post-compliance environment? Our webinar is now available to watch on-demand.
What will be covered?
Very-Near-Field testing of emissions can be done in seconds using a unique array of probes. These very-near-field “emissions maps” can be used to identify source of emissions and coupling paths to aid in debugging problems early in the design cycle lowering the risk of compliance issue at the qualification stage. The emissions maps can be even used to predict the EMC chamber results at a board level, reducing the need to go to a chamber during development. The excellent sensitivity and high resolution of the emission maps is useful in detecting self-interference problems and highlighting root causes down to a pin level. This seminar will show how the distributed array works and discuss using very-near-field measurements to solve emissions problems. Practical tips and a demonstration of an actual “real-time” EMxpert will be shown.
Click here to watch!
The presenter: Ruska Patton, M.Sc., Director of Product Management, EMSCAN
Ruska Patton is responsible for the evolution of EMSCAN's real-time near-field measurement solutions. He has a comprehensive understanding of general EMC, EMI and RF design and troubleshooting, with excellent skills in related software applications and programming. Mr. Patton holds both a B.Sc. and M.Sc. in Electrical Engineering from the University of Saskatchewan. During his time at University, he was recognized with numerous IEEE awards and a distinguished research scholarship.
EMSCAN is the world leading developer of FAST magnetic very-near-field measurement technologies and applications since 1989, providing real-time test solutions to antenna and PCB designers and verification engineers, without the need for a chamber.
The EMxpert, a family of compact EMC and EMI diagnostic tools, and the RFxpert, a family of antenna measurement tools, enable engineers to quickly optimize their designs. EMSCAN solutions dramatically increase designer productivity and substantially reduce time-to-market and project development costs. www.emscan.com