Calgary, AB, Canada – April 02, 2014: EMSCAN is proud to announce next webcast on “EMC/EMI Testing in less than One Second using Very-Near-Field Techniques”.

Overview
Very-near-field measurements of radiated emissions are fast and easy to make and avoid the delays and set-up needed for far-field measurements in a chamber.
A distributed array of sensors for measuring the very-near-field can sit on your desktop and will allow EM and RF testing in less than one second!
Using this technique a designer can get an “emissions map” of a PCB or product in “real-time” and identify EMI and EMC problems early in the design cycle thus saving time and cost. This technique can also visualize the source of emissions that caused systems to fail compliance test and provide the insight required to fix the problem quickly. An 8 GHz scanning limit means it can be used for very high frequency boards where EMI and signal integrity (SI) problems often converge. Advanced applications like high resolution scanning, passive intermodulation testing, multi-frequency support, self-interference detection and absorber performance can also be undertaken by this near-field technique.
This seminar will show how the distributed array works and discuss using very-near-field measurements to solve emissions problems. Practical tips and a demonstration of an actual “real-time” EMxpert will be shown.
This seminar is 45minutes in length. It is intended for engineers or technicians who are facing EMI and EMC issues in a pre- and post-compliance environment. In depth knowledge or EMC principles is not required to get a benefit from this seminar.

What will you learn?
* About the fastest method to capture very-near-field data
* How the very-near-field can be used to identify and debug EMC/EMI problems
* How the very-near-field can directly translate in pre-compliance level predictions

The presenter: Ruska Patton, M.Sc., Director of Product Management, EMSCAN
Ruska Patton is responsible for the evolution of EMSCAN’s real-time near-field measurement solutions. He has a comprehensive understanding of general EMC, EMI and RF design and troubleshooting, with excellent skills in related software applications and programming. Mr. Patton holds both a B.Sc. and M.Sc. in Electrical Engineering from the University of Saskatchewan. During his time at University, he was recognized with numerous IEEE awards and a distinguished research scholarship.

Register Here!

About EMSCAN
EMSCAN is the world leading developer of FAST magnetic very-near-field measurement technologies and applications since 1989, providing real-time test solutions to antenna and PCB designers and verification engineers, without the need for a chamber.
The EMxpert, a family of compact EMC and EMI diagnostic tools, and the RFxpert, a family of antenna measurement tools, enable engineers to quickly optimize their designs. EMSCAN solutions dramatically increase designer productivity and substantially reduce time-to-market and project development costs. www.emscan.com