Atlanta, GA and Melbourne, FL, USA – February 24, 2014: EMSCAN is proud to announce the upcoming seminar series on "Signal Integrity Considerations in the Design of Super Ultra Speed ( >2GHz ) PCBs". The seminar will be presented by the recipient of the prestigious "Lawrence G. Cumming Award of the IEEE EMC Society for outstanding service", 2002, the "Honorary Life Member Award" of the IEEE EMC Society, 2004, and the IEEE EMC Society "Technical Achievement Award" and the IEEE "Third Millennium Medal" Mr. Elya Joffe.

What will be covered?
Very-near-field measurements of radiated emissions are fast and easy to make and avoid the delays and set-up needed for far-field measurements in a chamber. They allow EM and RF testing in less than one second!
Using these techniques a designer can identify and prioritize signals, determine layout rules and choose the layer stack up scheme and perform a detailed look at termination, ground bounce, ringing, crosstalk and EMI and analyze all routing needs to determine overall and individual bus rules early in the design cycle thus saving time and cost.
This seminar will discuss using very-near-field measurements. Practical tips and a demonstration of an actual “real-time” EHX will be shown.
Who should attend?
You are facing EMI and EMC issues in the design of High Speed/High Density PCBs; don’t miss this seminar!
Registration
Please call +1-877-367-2261 ext:1 or send an email to info@emcan.com to register for any of these seminars.

The presenter
JOFFE, Elya B., K.T.M. Project Engineering, Kfar-Sava, Israel, and Senior EMC engineering Specialist and consultant.
Mr. Joffe has over 25 years of experience in government and industry, in EMC/E3, Electromagnetic Compatibility/Electromagnetic Environmental Effects, for electronic systems and platforms, in particular aircraft and aerospace. He is actively involved in the EMC design of commercial and defense systems, from circuits to full platforms.
His work covers various fields in the discipline of EMC, such as NEMP and Lightning Protection design, as well as numerical modeling for solution of EMC Problems. Mr. Joffe has authored and co-authored over 30 papers in the IEEE Transactions on EMC and Broadcasting, as well as in the proceedings of International EMC Symposia. He is Senior Member of IEEE, President of the IEEE EMC Society (2008-2009), member of the Board of Directors of the IEEE EMC Society and the Product Safety Engineering Society, and Chairs several Committees. He is also the Immediate Past Chairman of the Israel IEEE EMC Chapter and has served as a "Distinguished Lecturer" of the IEEE EMC Society.
Mr. Joffe has received several awards and recognitions from the IEEE and EMC Society for his activities. In particular, he is a recipient of the prestigious "Lawrence G. Cumming Award of the IEEE EMC Society for outstanding service", 2002, the "Honorary Life Member Award" of the IEEE EMC Society, 2004, and the IEEE EMC Society "Technical Achievement Award". He is also a recipient of the IEEE "Third Millennium Medal". Mr. Joffe is also a member of the " dB Society".

About EMSCAN
EMSCAN is the world leading developer of FAST magnetic very-near-field measurement technologies and applications since 1989, providing real-time test solutions to antenna and PCB designers and verification engineers, without the need for a chamber.
The EMxpert, a family of compact EMC and EMI diagnostic tools, and the RFxpert, a family of antenna measurement tools, enable engineers to quickly optimize their designs. EMSCAN solutions dramatically increase designer productivity and substantially reduce time-to-market and project development costs. www.emscan.com