Calgary, Canada – October 25, 2011: On October 25, 2011 issue, EE Times published a new Design Article that highlights how very-near-field EMI scanning lets designers measure and immediately display emissions profiles on a computer through an on-site benchtop system. The article covers electromagnetic emission test results and images for two new chip features. The imaging results, provided courtesy of National Semiconductor, used very-near-field EM scanning technology to generate the test results. The technology, developed and marketed by EMSCAN allows chip vendors (and other manufacturers of electronic devices) to quantify and immediately display spatial and spectral electromagnetic emissions profiles. The scan identifies both constant and time-based emission sources. The real-time spatial and spectral graphs let designers immediately identify the specific location and spectral profile of the EMI problem. Very-near-field testing allows board designers to pretest and resolve electromagnetic compatibility (EMC) and EMI problems without having to rely on results from a chamber. The two case studies featured in the article display before and after results for each of the two new features. The results verified the efficacy of the new design, documented the benefits, accelerated customer time-to-market and created a “wow” impact in customer documentation. The EMSCAN EMxpert for Real-time results™ provides examples of imaging results and more details about very-near-field EM scanning technology can be found at: http://emscan.com/emxpert/index.cfm

About EMSCAN
EMSCAN is since 1989 the world leading developer of FAST magnetic very-near-field measurement technologies and applications, providing real-time test solutions to antenna and PCB designers and verification engineers, without the need for a chamber.
The EMxpert, a compact EMC and EMI diagnostic tool, and the RFxpert, an antenna measurement tool, enable engineers to quickly optimize their designs. EMSCAN solutions dramatically increase designer productivity and substantially reduce time-to-market and project development costs. www.emscan.com

 



About EMSCAN
EMSCAN is the world leading developer of FAST magnetic very-near-field measurement technologies and applications since 1989, providing real-time test solutions to antenna and PCB designers and verification engineers, without the need for a chamber.

The EMxpert, a family of compact EMC and EMI diagnostic tools, and the RFxpert, a family of antenna measurement tools, enable engineers to quickly optimize their designs. EMSCAN solutions dramatically increase designer productivity and substantially reduce time-to-market and project development costs. www.emscan.com