EE Times Highlights Case Study of EM Emissions Scans of New Chip Features Used in Auto-Electronics
Calgary, Canada – August 19, 2011: On August 11, 2011, EE Times posted a new Design Article on the Automotive Design site that highlights electromagnetic emission test results and images for two new chip features. The imaging results, provided courtesy of National Semiconductor, used very-near-field EM scanning technology to generate the test results. The technology, developed and marketed by EMSCAN allows chip vendors (and other manufacturers of electronic devices) to quantify and immediately display spatial and spectral electromagnetic emissions profiles.
The two case studies featured in the article display before and after results for each of the two new features. The first study displays both spatial and spectral results for the Spread Spectrum Clock Generation (SSCG) feature. In the baseline test, the design team turned the SSCG function “Off” and then compared results with the SSCG turned “On.” The highly visual results display the obvious change in electromagnetic emissions.
The second study compared a second-generation half-duplex SERDES system with the third-generation full-duplex design. The methodology quantified and visually displayed the sources of emissions and documented compliance with test specifications developed by the Society of Automotive Engineers (SAE).
The SAE continually issues upgraded specifications for testing and verifying electromagnetic compatibility (EMC) and electromagnetic interference (EMI). EMC and EMI testing proves crucial for carmakers as they continually seek to differentiate their models with new consumer electronic systems. As a result, engineering design teams value instrumentation that facilitates rapid resolution of a wide variety of electromagnetic emissions related issues including filtering, shielding, common mode, current distributions, and broadband noise. The EMSCAN EMxpert for Real-time results™ provides examples of imaging results and more details about very-near-field EM scanning technology can be found at: http://emscan.com/emxpert/index.cfm
EMSCAN is since 1989 the world leading developer of FAST magnetic very-near-field measurement technologies and applications, providing real-time test solutions to antenna and PCB designers and verification engineers, without the need for a chamber.
The EMxpert, a compact EMC and EMI diagnostic tool, and the RFxpert, an antenna measurement tool, enable engineers to quickly optimize their designs. EMSCAN solutions dramatically increase designer productivity and substantially reduce time-to-market and project development costs. www.emscan.com
EMSCAN is the world leading developer of FAST magnetic very-near-field measurement technologies and applications since 1989, providing real-time test solutions to antenna and PCB designers and verification engineers, without the need for a chamber.
The EMxpert, a family of compact EMC and EMI diagnostic tools, and the RFxpert, a family of antenna measurement tools, enable engineers to quickly optimize their designs. EMSCAN solutions dramatically increase designer productivity and substantially reduce time-to-market and project development costs. www.emscan.com