World's fastest high resolution EMC scannerWorld's fastest high resolution EMC scanner

High density board & IC designers: accelerate design process by reducing EMC/EMI test times

Tired of waiting long hours to detect the causes of chip level EMC problems on your PCB?

Until now, conventional test methods like automated probes or hand-held probes were the only options to diagnose EMC problems on high density boards or chipsets. Testing a complete board with these conventional test methods can take half a day; even sometimes a day!

Looking for a fast, reliable and economical way to diagnose & debug your high density board after failing the compliance test in an anechoic chamber?

World’s fastest EMC/EMI diagnostic system EMxpert has been reinvented to assist high density board designers and chipset manufacturers to visualize the root causes of potential EMC and EMI problems during pre- and post-EMC compliance testing.

ERX+ obtains the 120 microns high resolution at an unrivalled speed by combining an electronically switched array of 1,218 probes with mechanical motion.

Now, you can identify hot spots or current loops on your high density board or chipset in seconds with ERX+ Level 1 resolution and then zoom into the problem area by selecting the resolution level based on the density of the board design.

With ERX+, for a fraction of an anechoic chamber cost you can quickly and easily:

Analyze your high speed, high power and/or high density/complexity PCB designs.

Visualize the root causes of potential EMC and EMI problems.

Find, characterize, and address unintended radiators or RF leakage.

Pinpoint in less than a second the cause of a design failure even an intermittent problem.

Prototype & test new designs, components and forms.

Test & optimize multiple PCB (printed circuit board) design iterations on your lab-bench.

Pre-test & resolve EMC and EMI problems early on to avoid unexpected EMC compliance test results

…all for a fraction of the cost of an anechoic chamber.

How does it work?

ERX+ consists of a patented scanner, a built-in adapter, a built-in spectrum analyzer and X/Y step motors. ERX+ measures the magnetic field (H-Field) in two orthogonal directions using H-field probes.

The patented scanner is a passive device that couples the very-near-field emissions from the device under test. The measurements of these coupled fields are done with the spectrum analyzer and the adaptor synchronizes the spectrum analyzer and the patented scanner.

EMxpert software knows the insertion loss of each individual probe across the frequency range so it can apply compensation for the internal losses of the scanner.

The software will also apply the antenna factor compensation that will result in accurate H-field data being displayed. Interpolation between probes is done by the software so that features smaller than the probe spacing can be resolved.

The patented scanner consists of 1,218 H-field (magnetic) probes that operate between 150kHz and 8GHz. Probes are wide band but not very sensitive across this band thus they are very good at rejecting background noise.

Each row and column on the patented scanner corresponds to a unique probe that is spaced every 7.5 mm into an electronically switched array, which provides an effective 3.75 mm resolution. Electronic switches enable the probes to sweep the entire board under one second when Level 1 is selected.

The scanner is placed right under the Gorilla Glass. X/Y step motors move the scanner (1218 probes) for higher resolution scans under the Gorilla Glass. After placing the DUT on the Gorilla Glass, user can select from seven different levels of resolution (0.12 mm - 7.5 mm).

The image on right is a representation of a 2 x 2 scan area on the scanner. At level 1, spatial scan is executed in real-time i.e. scanner doesn't move. The data is collected by each probe that is placed in the center of each grid.

At level 2, each grid is divided into four subgrids. Scanner first moves the orange dots and collects data from four subgrids. Scanner then moves to black dots and collects data from four subgrids. Scanner then moves to green dots and collects data from four subgrids and finally, scanner moves to purple dots and completes the scan.

At each level, one grid is divided into four subgrids which means four measurement points. Level 7 is the highest resolution (120 microns) and the maximum number of measurement points in one grid can be 4,096.

How does the world's quickest and cheapest antenna pattern measurement system RFxpert work?


Identify hot spots or current loops in seconds with ERX+ Level 1 resolution and then zoom into the problem area

ERX+ provides spatial and spectral scans that allow design teams to address EMC design problems at their lab-bench in real-time.

Spectral scan measures and displays the maximum amplitude vs. frequency of the magnetic field strength over the scanned area. To characterize emissions, ERX+ quickly scans the board across a broad frequency range (150kHz - 8GHz). You can then select and characterize specific frequencies to observe how the noise evolves spatially across the frequency range. This allows the design team to map the noise, confirm its source, and implement appropriate mitigation. A spectral scan result is shown below. You can mouse over the spectral graph and analyze the problem frequency and amplitude.

Spectral scan to diagnose EMC design problems

The ultimate advantage of ERX+ is the real-time spatial scan which measures the magnetic field of radiated electromagnetic emissions from the DUT at a single frequency as a function of position. ERX+ maps near-field emissions generated by current flow on the surface of the board. Measurements occur in real-time and this allows the design team to compare different design versions in seconds. Below graphic shows level 1 and level 7 spatial scan results of a high density board.

Spatial scan to locate the sources of EMC design problems

Isolate individual traces and vias, and highlight coupling points between traces

ERX+ allows the designers and the engineers to find the source of emissions and the path taken by the problem emissions down to a single trace and via across multiple PCB layers. An example is shown below.

Since 1989, EMSCAN is the world’s leading developer of fast magnetic very-near-field measurement technologies and applications, providing real-time test solutions to antenna and PCB designers and verification engineers, without the need for a chamber.

The EMxpert, a compact EMC and EMI diagnostic tool, and the RFxpert, an antenna measurement tool, enable engineers to quickly optimize their designs. EMSCAN solutions dramatically increase designer productivity and substantially reduce time-to-market and project development costs.

REQUEST A FREE evaluation demo kit

Demos are facilitated by a dedicated application engineer, not a sales person.

or call 1-877-367-2261

EMxpert customers

EMxpert customers

EMxpert customer testimonials
Andy Pienkowski,
Science Principal RF Wireless
Broadcom Europe

reduce test time to debug EMC design problems

REQUEST A FREE evaluation demo kit

Demos are facilitated by a dedicated application engineer, not a sales person.

or call 1-877-367-2261

EMxpert customer testimonials
Joel Burcham,
Chief Technical Officer

reduce time to market by debugging EMC design problems in real-time

EMxpert customers

EMxpert customers

reduce test time to debug EMC design problems

REQUEST A FREE evaluation demo kit

Demos are facilitated by a dedicated application engineer, not a sales person.

or call 1-877-367-2261